Common
Molding-related
Failure Mechanisms:
Package cracking
-
occurrence of
fracture anywhere in the package
Package stress-related
electrical failure
-
non-conformance to electrical specifications due to component
degradation caused by stresses on the die surface
Wiresweeping
- swaying or movement of the wires during molding along the
direction of mold flow which may result in broken wires or wire
shorting
Package Voids and Pits
- imperfections on
the package surface (pits) or body (voids) characterized by
vacancies of plastic material
Incomplete Filling
- insufficient
encapsulation resulting when the molding compound fails to fill up
the cavity during molding
Blistering
-
appearance of blisters on the package surface
Package Delamination
- any disbonding
between the molding compound and another material of the package
Excessive
Flashes - presence of unacceptable amounts of plastic on the
edges of the package after molding
Solder
Voids - exposure of
any part of the lead base metal resulting when excess flashes that
covered the leads during
leadfinish are removed
Mark
Permanence Failure
-
inability of the entirety of an ink mark to remain on the
package
Front-End Assembly
Links:
Wafer Backgrind;
Die Preparation;
Die Attach;
Wirebonding;
Die Overcoat
Back-End Assembly
Links:
Molding;
Sealing;
Marking;
DTFS;
Leadfinish
See Also:
IC
Manufacturing; Assembly Equipment
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