Mil-PRF-38535
Standard
The
Mil-PRF-38535
is a performance-based specification document that defines the general
requirements, as well as the
quality assurance
and reliability requirements,
for the manufacture of microelectronic or integrated circuits intended for use in military applications and
related government microcircuit application programs.
Unlike
the rigid military standards of the past, however, the
Mil-PRF-38535 is designed to provide microcircuit manufacturers with
maximum
flexibility
to employ the industry's
best
commercial
manufacturing
practices while still achieving the government's required quality and
reliability levels. To be
granted such privilege, a manufacturer must first be certified to what
is known as the
Qualified
Manufacturer Listing (QML),
by complying with certain requirements of the Mil-PRF-38535.
Developed
in 1995, the QML program aims to move the defense procurement process
away from its erstwhile strict, regimented specifications to a newer
system based on best commercial practices.
A non-QML-certified
manufacturer must adhere to the stringent and non-flexible requirements
of the military for the manufacture and repetitive testing of its
military products. Once a manufacturer is granted QML status,
however, it is allowed to use best-known commercial practices to
manufacture its products using its own process flows, as long as these
are shown by
data
to produce products that meet military standards. Thus, a QML-certified
manufacturer is free to pursue continuous improvements on its own,
usually in the form of
elimination
of
non-value-added
process steps.
The first
requirement of Mil-PRF-38535 is for the manufacturer to have a
quality management (QM)
program that is documented in its QM plan. The manufacturer must
subject its QM program to self-assessments, results of which shall be
made available for review.
The manufacturer must also
form a
Technical
Review Board (TRB),
which shall be responsible for the following: 1) development of the QM
plan; 2) control of process changes, which includes qualification and
certification of all processes; 3) analysis of reliability data; 4)
failure analysis functions; 5) implementation of corrective action and
recall procedures; etc.
The TRB shall maintain
records of all its deliberations and decisions, which shall be made
available for review. The TRB shall ensure that the
QM plan
includes the following: 1) quality improvement plan; 2) failure analysis
program; 3) statistical process control (SPC) plan; 4) corrective action
plan; 5) change control program; 6) standard evaluation circuit (SEC)
and technology characterization vehicle (TCV) program; and 7)
certification and qualification plan.
The Mil-PRF-38535 also defines
requirements for
change control
procedures. All changes to any part of a QML manufacturer's line
are to be governed by the manufacturer's TRB. Any change shall be
documented as to the reason for the change with relevant data taken to
support the change, including reliability data as appropriate. The
criticality of the change shall be based on the
effects
of the change on quality, reliability, performance, and
interchangeability of the resulting microcircuits. The next page shows
examples of manufacturing process changes that require TRB evaluation
and approval per Mil-PRF-38535.
Table 1.
Examples of Changes that Require TRB Approval per Mil-PRF-38535
Area |
Changes Subject to TRB Evaluation |
Design |
-
technology database
- design
flow
- design
system
-
software updates
- model
or modeling procedures
|
-
configuration management
-
radiation hardness assurance (if applicable)
-
electrical performance |
Wafer Fab |
-
fabrication process sequence or process limits
-
fabrication process materials or material specs
-
photoresist materials or material specs
- doping
material source, concentration, or process technique
-
cross-section diffusion profile
-
passivation or glassivation material, thickness, or technique
-
metallization system (pattern, material, deposition/etch
technique, line width/thickness)
-
bond pad geometry, spacing or metallization
-
baseline
-
conductor, resistor, or dielectric materials
- wafer
fab move from one line or building to another
|
-
passivation or glassivation process-
oxidation or diffusion process, oxide composition and thickness,
oxidation temperature and time
-
sintering or annealing temperature and time
- SEC
and how it is tested
- method
of mask making
-
parametric monitor and method of test
- wafer
acceptance criteria
- TCV
and how it is tested
-
sampling plans
- gate
formation process, material, technique
-
backside process including wafer thinning and backside
metallization
- ohmic
contact formation
-
starting material qualification
- lot
formation |
Assembly |
- die
attach material, method, or location
-
wire/ribbon bond interconnection method
- wire
material, composition, and dimensions
- seal
technique (materials, process, etc.)
-
internal visual inspection and other test procedures
-
assembly flow
-
assembly operation move |
-
scribing and die separation method
- TCI
procedures including manufacturer imposed tests
-
screening tests
-
sampling plans
- die
back surface preparation
-
molding material, method, or location
- chip
coating material and technique
- device
marking process
- lot
formation |
Package |
- vendor
-
external dimensions
- cavity
dimensions
- number
of leads or terminals
- lead
or terminal dimensions
- lead
or terminal base material
- lead
or terminal plating material
- lead
or terminal plating thickness
-
package body material
-
package body plating material
-
package body plating thickness
- die
pad material
- die
pad plating
- die
pad plating thickness |
- lid
material
- lid
plating material
- lid
plating thickness
- lid
seal (preform) material
- lid
glass seal material
- lead
glass seal material
- lead
glass seal diameter
- leads
or terminal spacing
- lead
configuration (e.g., J-lead, gullwing, etc.)
- die
size
- device
marking
- lead
attachment |
Test |
-
internal visual inspection and other test procedures
-
testing flow
- test
facility |
-
sampling plans
- test
procedures
- lot
formation |
|
The
Mil-PRF-38535, as mentioned, defines the requirements for a manufacturer to be QML-certified.
The generic
QML
certification
process consists of: 1) quality management program documentation; 2)
process capability demonstration; 3) qualifying activity management and
technology validation; and 4) demonstration of the manufacturer's
control of any off-shore operations.
Process
capability demonstration
consists of building actual devices and performing tests on them, as
well as running software benchmarks necessary to demonstrate that the
manufacturer has a good comprehension of how manufacturing process
capability relates to quality, reliability, and manufacturability.
To demonstrate
design process capability,
the manufacturer shall provide evidence of the capability of its design
methodologies for the following design areas: 1) model verification; 2)
lay-out verification; 3) performance verification; and 4) testability
and fault coverage verification.
To demonstrate wafer fab
process capability, the manufacturer shall identify a specific
technology or technologies for wafer fabrication. Wafer fab capability
demonstration consists of showing data and documentation that support
the qualification of the various materials and processes of the wafer
fab steps (e.g., oxidation, metal deposition, diffusion, implant,
photolithography, passivation/glassivation, etc.). Reliability test
data, parametric monitor test data, wafer acceptance test data, mask
inspection and defect density data, rework data, among others, must also
be presented.
A Technology
Characterization Vehicle
(TCV)
program must likewise be implemented by the manufacturer for every
technology to be certified. This program must involve the development of
test structures
needed to characterize a technology's susceptibility to intrinsic
reliability failure mechanisms such as electromigration, TDDB, and hot
carrier effects. The manufacturer must also
use a Standard Evaluation Circuit
(SEC)
to demonstrate the
reliability of every wafer fab technology being considered for
certification. The SEC must be designed solely for its role as a quality
and reliability monitoring device.
To demonstrate
assembly/packaging
capability, the SEC
or an actual product of the manufacturer must pass the required
package qualification and certification process, which includes a
variety of Mil-Std-883 test methods that depend on the assembly process
step being qualified, and as per Tables I and II of paragraph
3.5.1.3.6 of Mil-PRF-38535. Packages must likewise meet required
thermal and electrical characterizations for QML-certification.
Initial QML
qualification testing shall be performed on two microcircuit devices,
referred to as 'demonstration vehicles', which were produced by the
manufacturer on its actual manufacturing line. The manufacturer
shall present a
qualification
plan
that details the qualification test flow, test limits, test data to be
collected and analyzed, and test sampling techniques. The
qualification plan must likewise document the materials and
manufacturing information as well as the traceability records for the
demonstration vehicles.
Once the
qualification testing has been completed, the manufacturer must present
a
qualification test report,
which details the analysis of the qualification data. The analysis
must show that the process or technology being certified is under
control and repeatable. If failures
are encountered during the qualification testing, failure analysis must
be conducted on the failures so that corrective actions, if needed, may
be undertaken. After the corrective actions have been completed,
the qualification testing must be
restarted
on new demonstration vehicles from the corrected process.
A
certificate
of qualification shall be issued to the manufacturer once all the
requirements for QML certification have been completed. To
retain
its qualification status on the QML, the manufacturer must perform
regular qualification tests on selected SEC's and TCV's or perform
alternative assessment procedures as documented in its QM plan.
See Also:
Mil-Std-883 Methods; Mil
QCI Group Tests; Mil
Lot Screen Tests
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