Die Stacking
                       
        
        
        
        
        
                
        
        
         
                       
        
        
        
        
        
                
        
        
            
        
        
        
        
        
        
        
        
        
        
        
        
        
        
      Die Stacking 
      is the process of mounting multiple chips on top 
      of each other within a single semiconductor package. 
      Die stacking, which is also known as 
      'chip stacking', significantly 
      increases the amount of silicon chip area that can be housed within a 
      single package of a given footprint, conserving precious real estate on the printed circuit 
      board and simplifying the board assembly process. Aside from space 
      savings, die stacking also results in better electrical performance of the 
      device, since the shorter routing of interconnections 
      between circuits results in faster signal propagation and reduction in noise 
      and cross-talk. 
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
      Early applications of stacked 
      die involved the stacking of two memory chips on top of each other, such 
      as Flash and SRAM devices.  Today, however, die stacking technology 
      has advanced beyond 'mere' memory chip stacking, and may now 
      involve six or more chips of varying function or technology, e.g., logic, 
      analog, mixed-signal, etc. Indeed, die stacking is now synonymous with 
      'vertical 
      integration', 
      or the integration of circuits in vertical fashion instead of the 
      traditional horizontal or planar approach.
                       
        
        
        
        
        
                
        
        
                       
        
                       
        
        
        
        
        
                
        
        
        Die stacking 
        naturally started out with a pyramid style of piling up smaller die on 
        top of larger ones.  
        The technology has advanced into something that finds no limit in the 
        sizes of chips to stack. It is now common to see a stack of equal-size 
        die, or even a larger die on top of a smaller one. One technique 
        developed is to place a 
        spacer 
        (a dummy 
        layer of silicon) between two die, so that the bond wires are not 
        crushed even if the top die is larger than the bottom die. 
        Unfortunately, the use of spacers between die add to the total package 
        thickness.  
                       
        
        
        
        
        
                
        
        
               
        
        
        Tessera Inc. 
        pioneered the technique of folding stacked die to eliminate the need for 
        spacers between them, calling the process  
        'folded/stacked' technology. 
        The die are produced side by side and then folded over so that the bond 
        pads are independent of each other.  A relieving layer is placed between 
        the chips to alleviate thermomechanical stresses.
        
             
        
        
        The 
        interconnection of the stacked die within a 
        package presents an even more 
        daunting challenge, especially if wirebonding is employed. Aside from 
        the mechanical intricacies involved in managing the complex lay-out of 
        hundreds of microscopic wires subject to loop profile restrictions, 
        cross-talk during device operation must likewise be avoided. At times, 
        such as when digital, analog, and RF circuits need to be integrated 
        together, the solution would require the use of two interconnection 
        technologies (wirebonding 
        and flipchip bonding) to get the required results.
        
        
        
        
        
             
      
        
        
        
        
        
        
        
        
        
        
                
        
        
        
        
        
        
        
        
        
        
        Figure 1. 
        Wirebonding complexity required by die stacking;
        
        as reconstructed 
        from photos posted in www.ap.pennnet.com
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        Stacked die 
        may be interconnected using wirebonding alone, or by a combination of 
        wirebonding 
        and 
        flipchip 
        assembly. 
        The use of wirebonding as the exclusive means of interconnection is 
        somewhat restrictive, since the number of stacked die that may be 
        wirebonded may be limited to only three. Nonetheless, a common technique 
        employed for wirebonding stacked die is to wirebond each die 
        individually to the substrate.  The conductor patterns on the substrate 
        take care of interconnecting the die to each other and to the outside 
        world. 
        
        
             
        
        Die that are 
        wirebonded to the substrate must have a 0.5-1 mm shelf or exposed area 
        around its periphery to allow the formation of the necessary loops 
        during wirebonding. Die-to-die wirebonding is also done, but this 
        requires the bottom die to be sufficiently larger than the top die, to 
        allow enough room for the wirebond connections.  
        Wirebonding 
        of stacked die could call for  loop heights that are less than 100 
        microns, which are much more challenging than loop heights of 150-175 
        microns commonly seen in conventional 
        wirebonding of unstacked die. 
                       
        
        
        
        
        
                
        
        
              
        
                       
        
        
        
        
        
                
        
        
                       
        
        
        
        
        
                
        
        Die stacking 
      is fraught with challenges other than those of wirebonding. One of these 
      is the need to keep the stack thermally and mechanically stable on the 
      substrate.  At the same time, the resulting package must be as thin 
      as possible, with die interconnections that are electrically good and 
      reliable. Of course, the final thickness of the package depends on the 
      number of die in the stack. As an example, current technology would generally require a 1.4-mm
        chip scale package (CSP) 
        to accommodate a six-die stack while a four-die stack can fit within a 
        1.2-mm CSP.
                       
        
        
        
        
        
                
        
        
            
                       
        
        
        
        
        
                
        
        
        
        
      Wafer thinning,
      
      thin-wafer handling, 
      and thin 
      die attach 
      are essential elements of successful die stacking. Wafer thinning still 
      involves conventional wafer backgrinding, but it must be followed by a 
      polishing step that relieves stresses imparted by the backgrind process to 
      the wafer.  Wafers intended for die stacking can be thinned to just 
      3-6 mils, depending on the use and the wafer size. Wafers that are this 
      thin are already inherently weak, and require special handling and 
      transport systems to ensure their proper support at all times. Die attach 
      of very thin die, in particular, can be very challenging.  The 
      application of preformed tape epoxy on the wafer backside prior to sawing 
      is one technique that facilitates die attach of very thin die.
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
      
                       
        
        
        
        
        
                
        
        
        Figure 2. 
        Side view of wirebonded stacked die;
        
        Photo source:
        
        www.kns.com
                       
        
        
        
        
        
                
        
        
                       
      
                       
        
        
        
        
        
                
        
        
              
      
                       
        
        
        
        
        
                
        
        
        
      Another challenge in die 
      stacking is the ability to pick 
      
      known good die (KGD) 
      
      from a 
      wafer. The inadvertent use of defective die in die stacking will result in 
      yield losses and higher costs. Unfortunately, wafer-level testing is often 
      not enough to ensure that only KGD's will be picked for die stacking, 
      especially if the device involved is a complex circuit. Thus, poorly 
      yielding wafers that are difficult to test at wafer level are not good 
      candidates for die stacking.
                       
        
        
        
        
        
                
        
        
          
                       
        
        
        
        
        
                
        
        
        
      Substrate thickness 
      is also an important factor in die stacking. The thickness of the 
      substrate adds to the over-all package thickness.  This means that 
      for a given package height, increasing the substrate thickness will 
      decrease the number of die that can be stacked on it.  Stacked die 
      that involve complex devices may require complex substrate routing, which 
      in turn would require additional layers or laminates within the substrate. 
      The core thickness and the number of laminate layers define the over-all 
      substrate thickness. Die stacking should therefore involve some form of 
      substrate engineering to keep the required number of substrate layers and 
      their thicknesses to a minimum.
                       
        
        
        
        
        
                
        
        
          
                       
        
        
        
        
        
                
        
        
      Die stacking becomes less 
      attractive as the number of die to be stacked increases and as the die 
      involved become more expensive or complex.  In such cases, engineers 
      are more inclined to employ 
      package stacking 
      instead of die stacking.
                       
        
        
        
             
      	
          
      
                       
        
        
        
        
        
                
        
        
      Primary Reference:
      http://www.elecdesign.com
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
      
      See Also:  
		System in a 
        Package;  Wafer 
        Backgrind;  Die 
        Attach;  
        Wirebond
            
         
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