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Computation of
Electrical Shift/Drift After Rel Test
Large changes
in the read-outs of some electrical parameters of rel samples after they
have been subjected to reliability testing may
be an indication of a device problem that can result in field failures
later on. As such, the % shift or % drift of these electrical
parameters need to be understood, especially if they result in
electrical test failures after the reliability
tests. This is the topic of the archived forum thread below.
Posted by Rivs: Wed
Jan 16, 2008 1:42 pm Post
subject: Electrical %shift / drift computation |
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guys need again your expertise
I'm doing a electrical %shift / drift on our devices
after reliability test and using the formula of
(pre-test data - post-test data / pre-test data * 100)
are you using the same formula as I am ? please help, is
there any standards used for this? |
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Posted by FARel Engr:
Thu Jan 17, 2008 3:39 am
Post subject: |
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Hi Rivs, what kind of device are
we talking about and which particular parameter of this
device is being measured for the shift/drift? |
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Posted by Rivs: Thu
Jan 17, 2008 8:04 am Post
subject: |
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FARel thanks for the immediate response, I am talking
about discrete devices such as FETs, Thyristors,
Rectifiers etc . . . Actually all the electrical test
parameters are being measured like breakdown voltages,
leakage current, forward voltage, etc . . . |
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Posted by Paula: Thu
Jan 17, 2008 9:27 am Post
subject: Re: Electrical %shift / drift computation |
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I can't recall but I think, logically, it should be
(post-pre)/pre * 100. An increase will give you a +
drift while a decrease - drift.
Back when I worked for discrete, we do drift analysis
for all reliability tests. The good thing is our tester
are capable of datalogging parameters, then we have a
DOS (batch) program where we run this datalog and in a
minutes you can get drift data of different parameters
from a given reliability sample size simultaneously. |
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Posted by Rivs: Thu
Jan 17, 2008 9:56 am Post
subject: |
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Paull thanks this is what I used
before. I just want to have a copy of any standards that
says so. Do you have or know one? |
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Posted by Paula: Thu
Jan 17, 2008 1:24 pm Post
subject: |
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Try JESD86. |
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Posted by Rivs: Thu
Jan 17, 2008 1:41 pm Post
subject: |
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Paula sorry for the typo error I'm in a hurry this
morning, Thanks for the info I'll try to look at this |
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