Material to be Etched |
Chemicals |
Ratio |
Comments |
Silicon
(Si) |
HF : HNO3
: Water |
2:2:1 |
--- |
Silicon
(Si) |
HNO3:
HF : Acetic Acid |
5:3:3 |
--- |
Silicon
(Si) |
NaOH in
Water |
--- |
for
dissolving the die from the package to allow inspection of
eutectic die attach;
16 hours
@ a temperature near boiling point |
Silicon
dioxide (SiO2)-
thermally grown |
NH4F:HF |
6:1 |
Buffered
HF;
120
nm/min @ 25 C |
Silicon
dioxide (SiO2)-
thermally grown |
HF :
Water |
1:10 |
slower
etch;
30
nm/min @ 25 C |
Silicon
dioxide (SiO2)-
thermally grown |
HF :
Water |
1:100 |
very
slow etch;
1.8
nm/min @ 25 C |
Silicon
dioxide (SiO2)-
thermally grown |
HF |
--- |
very
rapid etch;
1.8
microns/min @ 25 C |
Silicon
dioxide (SiO2)-
CVD |
HF :
Water |
1:10 |
--- |
Silicon
dioxide (SiO2)-
Phosphorus-doped |
HF :
Water |
1:10 |
--- |
Silicon
nitride (Si3N4) |
refluxing phosphoric acid |
--- |
use at
180C;
6.5
nm/min @ 25 C;
will
also etch Al rapidly; plasma etching is preferred for removing Si3N4 |
Silver
(Ag) |
NH4OH
: H2O2 |
1:1 |
rapid
etch |
Silver
(Ag) |
HNO3
: Water |
1:1 |
--- |
Tantalum
(Ta) |
HF : HNO3
: Water |
2:2:5 |
--- |
Tin (Sn) |
HF : HNO3 |
1:1 |
--- |
Tin (Sn) |
H2SO4 |
--- |
use at
80 C |
Titanium
(Ti) |
HF : H2SO4
: Water |
1:30:69 |
use at
70 C |
Titanium-Tungsten (TiW) |
H2O2 |
--- |
very
selective;
5 nm/min
@ 25 C |
Tungsten
(W) |
HF : HNO3 |
1:1 |
--- |
Vanadium
(Va) |
HF : HNO3
: Water |
1:1:1 |
--- |