Semiconductor
Test Parameters
The correct
and efficient electrical testing of finished products is a critical
aspect of semiconductor manufacturing. Electrical testing ensures that
the customers will receive devices that operate in accordance with the
devices' published electrical specifications.
The electrical
testing of semiconductor products basically consists of subjecting them
to a series of 'test blocks', each of which tests them for a certain
electrical characteristic, or
test parameter.
The complete set of test blocks is often referred to as the 'test
program' for that device.
Every test block therefore needs to
provide the device under test (DUT) with a predetermined set of
electrical stimuli that correspond to the test parameter being checked.
The DUT's response to these stimuli is then compared to an expected
result.
To determine
whether a DUT passes a test or not, each test parameter must have preset
limits against which the DUT's response is compared. Some
parameters have both lower and higher specification limits, while others
just have either a lower or higher specification limit.
The following links present examples
of test parameters for the device types indicated:
-
Test Parameters for Operational
Amplifiers
-
Test Parameters for A/D Converters
-
Test Parameters for D/A Converters
-
Test Parameters for SRAMs
