Plotting 
      Lognormal Distributions
		
        
        
        
        
        
        
        
          
        
        
        
        A 
        life 
        distribution 
        is a collection of time-to-failure data, or life data, graphically presented as 
        a plot of the number of failures versus time.  It is just like any 
        statistical distribution, except that the data involved are life data. The 
        lognormal distribution is one of the most frequently used distributions 
        in analyzing life or reliability data in the semiconductor industry.  
        
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
         
        The reason 
        why semiconductor life data fit the lognormal distribution very well is 
        because the lognormal 
        distribution is formed by the 
        
        multiplicative 
        effects of random variables, and multiplicative interactions of variables 
        are frequently encountered in many semiconductor failure mechanisms.  
        
        
                         
        
        
        The 
        
        lognormal 
        life distribution 
        is one wherein the natural logarithms of the lifetime data, ln(t), form 
        a normal distribution.  Consequently, the life data of a lognormal 
        distribution will also form a straight line if plotted on a 
        lognormal 
        plot, 
        i.e., a plot whose x- and y-axes stand for the cumulative % of failures 
        and the logarithmic scale of time, respectively.  
        
        
              
        
        
        Life data are often analyzed 
        on a per failure 
        mechanism basis.  
        Thus, an engineer who wishes to study the tendency of a device to fail 
        by electromigration will conduct accelerated electromigration testing on 
        a set of samples to generate the device's life data with respect to 
        electromigration, i.e., the individual lifetimes exhibited by the tested 
        samples before they fail by electromigration.  
		
           
		
        
        
        
        
        
        
        
        
        
        
        
         If one were 
		to plot the cumulative % of failures corresponding to these life data 
		against time on a lognormal
        plot, one would see 
        that a 
        straight line 
        will emerge.  Figure 1 shows an example of a lognormal plot.
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
        
			
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        Figure 1. 
        An example of a lognormal plot using a lognormal  
        plotting 
        sheet from Technology Associates | 
		
		
		    
		
		
		
		
		
		
        
        
        
        
        
        
        
        
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        
        
        
        
        
		
		
		
		
		
		
		
		
		
		
		
        Basic 
        guidelines 
        for generating a lognormal 
        plot include the following: 1) plot life data from a single failure 
        mechanism only per plot; 2) use a data collection time interval that is 
        in geometric progression so that the points will appear to be equally 
        spaced in the log time scale; 3) plot all obtained data points, even 
        those that reflect no additional failures and therefore resulting in the 
        same cum % failures as the previous point; 4) plot actual data only - do 
        not add unknown or unverified data; 5) draw an eyeball straight line 
        through the data points, slightly giving more emphasis to data points 
        near the media. 
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
        
         
        
        
        
        Once the plot 
        has been created, one can estimate the 
        median 
        lifetime 
        of the population 
        by interpolating from the plot the time at which 50% of the failures 
        would have occurred (in the example plot above, t50 is approximately at 
        150 hours). Also, an estimate, s, of the 
        standard 
        deviation 
        (shape parameter) of the distribution may be obtained by drawing a line 
        parallel to the distribution plot but passing through the bull's eye on 
        the right side of the horizontal line t=10; s is where this line 
        intersects the sigma nomograph on the right (in the example plot above, 
        s is approximately 1.8). The ability to estimate cumulative percent 
        failures from lognormal plots is an important tool in reliability 
        assessments.
		
         
		       
		
      
        
        See 
        also:
        
        
        Reliability
        Engineering;  Life Distributions; Life Distribution Functions; 
		
        Reliability
        Modeling; Failure
        Analysis;  
        LTPD/AQL Sampling
        
                                  
        
        
        Primary 
        Reference: 
        D. S. Peck and O. D. Trapp, Accelerated Testing Handbook, Technology 
        Associates.  
        
                 
        
        
        
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