Metallizations Used in Semiconductor Manufacturing
Semiconductor
devices employ
metallizations
primarily to serve as a means of electrical contact and interconnection
within the die circuits. Thin-film aluminum is the most widely used
metallization in semiconductor manufacturing because of its many
desirable properties, but there are many other metals or alloys used for
the same purpose. Table 1 shows examples of such metals and alloys
along with some of their properties.
The last
column of Table 1 pertains to the critical temperature beyond which the
metallization on silicon becomes unstable in one of several ways:
further reaction with silicon, decomposition, agglomeration, or
mechanical failure. These temperatures were determined either by
experimentation or experience within the industry.
Table 1.
Properties of Metallizations Used in Integrated Circuits
Metal/Alloy |
Resistivity
(µΩ-cm) |
Melting Temp. (deg C) |
CTE
(ppm/deg C) |
Reaction Temp with Silicon
(deg C) |
Max. Temp. Stable on Si
(deg C) |
Al |
2.7-3.0 |
660 |
- |
~250 |
~250 |
M |
6-15 |
2620 |
5 |
400-700 |
~400 |
W |
6-15 |
3410 |
4.5 |
600-700 |
~600 |
MoSi2 |
40-100 |
1980 |
8.25 |
- |
>1000 |
TaSi2 |
38-50 |
~2200 |
8.8-10.7 |
- |
>=1000 |
TiSi2 |
13-16 |
1540 |
12.5 |
- |
>=950 |
WSi2 |
30-70 |
2165 |
6.25-7.9 |
- |
>=1000 |
CoSi2 |
10-18 |
1326 |
10.14 |
- |
<=950 |
NiSi2 |
~50 |
993 |
12.06 |
- |
<=850 |
PtSi |
28-35 |
1229 |
- |
- |
<=750 |
Pt2Si |
30-35 |
1398 |
- |
- |
<=700 |
HfN |
30-100 |
~3000 |
- |
450-500 |
450 |
ZrN |
20-100 |
2980 |
- |
450-500 |
450 |
TiN |
40-150 |
2950 |
- |
450-500 |
450 |
TaN |
~200 |
3087 |
- |
450-500 |
450 |
NbN |
~50 |
2300 |
- |
450-500 |
450 |
TiC |
~100 |
3257 |
- |
450-500 |
450 |
TaC |
~100 |
3985 |
- |
- |
- |
TiB2 |
6-10 |
- |
- |
>600 |
>600 |
Reference:
Sze, "VLSI Technology", McGraw Hill
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LINKS:
Metallization;
Thin Films; Ohmic
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