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Internal Void Monitoring Using X-Ray
The presence
of voids in the die attach material and the package body of a device is
undesirable. Voids can lead to lower mechanical strength and may allow
excessive ingress of moisture and contaminants into the package.
As such, many companies employ various ways of detecting and controlling
such voids. X-ray radiography is a useful technique for internal
inspection of a package. Unfortunately, X-ray inspection is not
effective in detecting voids in plastic packages and non-conductive
epoxy die attach material. The ineffectiveness of X-ray inspection
for detecting voids in plastic devices is tackled in the archived forum
thread below.
Posted by
Mike_balbuena: Thu May 04, 2006 5:23 am
Post subject: Internal Void Monitoring Using X-ray |
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Does anyone does this in their
back-end assembly area? What is the criteria and what
equipment are you currently using?
I remember generating the criteria for OSEP a while
back( 1999) but I forgot already. I would appreciate any
help and feedback. I was thinking for incorporating this
again on our current process to preliminary monitor
delam.
Thanks in Advance.
Mike |
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Posted by Jefriz: Tue
May 09, 2006 7:26 pm Post
subject: |
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Mike,
We use that kind of inspection scheme in my previous
company but it does not give much accurate result. You
are going to look for 2 kinds of voids, DA region and
the mold area. If you are using non-conductive epoxy,
chances are you can't see the epoxy and the void using
X-ray. Mold compound void is also hard to see using
X-ray. I would recommend you use Through scan (T-scan).
Then use C-scan for confirmation when you see a void/delamination
to determine which layer have the anomaly.
Criteria for X-ray, you can try looking at MIL-STD-883F
Method 2012.7. For package delamination (void), use
J-STD-020C. This would give you defferent criteria on
each area affected.
Added suggestion, if you see suspected delamination/void
using T-scan/C-scan, don't just stop there, confirm it
with cross section.
Jefriz |
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Posted by
Mike_balbuena: Tue May 09, 2006 11:51 pm
Post subject: |
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Thanks, Jef. Appreciate that
input.
Regards,
mike |
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Posted by newbie PE:
Sun Jul 02, 2006 5:06 am
Post subject: |
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i remember my trainor's words
when that question was raised while on training, he
thinks there's no x-ray capability to detect voids yet,
it has something to do with the material composition/
properties versus the capability of what x-ray waves can
travel...
we usually use CSAM/ SAT for delam and void
monitoring... |
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Posted by FARel Engr:
Mon Jul 03, 2006 12:08 pm
Post subject: |
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Yup - the X-ray image formed by
X-ray machines is based on the principle that the
different densities of the different features of the
package block x-rays at different levels. Denser/thicker
features cast a heavier x-ray 'shadow' and appear darker
on the image.
Plastic molding compound is not a dense
material, and blocks x-rays minimally. This is the
reason why plastic package cracks and voids are so
difficult, if not impossible, to detect using x-rays -
plastic molding compound offers very little x-ray
contrast against open spaces.
X-ray, however, would be a good detector of cracks and
voids in ceramic packages and eutectic die attach, since
ceramic and gold are denser than plastic. |
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