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PQFN Package Cracking After Temp Cycle
Plastic
package cracking is usually not difficult to detect, but it can be quite
challenging to analyze up to its root cause level. Determining the exact reason
for the occurrence of a package crack can go through great lengths that
includes failure mechanism simulation using actual production equipment.
Every package crack investigation, however, must start with a proper
review of all available data pertaining to the affected lots, so that
patterns as to what could have led to the problem can be established.
For example, are there common machines, operators, or even work shifts
involved in the affected lots? Also, a thorough failure analysis
of the dead bodies must be done to determine the origin and propagation
of the crack as well as the nature of the stress that caused it.
In the archived forum thread below, these are some of the suggested
actions for the PQFN package cracking issue raised by the thread
starter.
Posted by Rivs: Sat
Jul 07, 2007 8:26 am Post
subject: PQFN 3 x 3, 3.3 x 3.3 & 5 x 6 Package Crack
After TC |
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Dear All,
Just want to seek your expertise help, We are
encountering package cracking on our PQFN packages after
temperature cycling of 100, 250, 500 to 1000 cycles. TC
condition is -65 to 150 30 minutes per cycle.
We have not encountered this during our initial build
(2006) and for verification we'ved evaluated both 2006 &
2007 build wherein package crack is only seen on the
2007 build parts and none on the 2006 build.
No materials nor process procedure changed since 2006.
Hope someone here can give us inputs on how we can
identify the rootcause of this. |
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Posted by Paula: Mon
Jul 09, 2007 10:16 am Post
subject: pqfn |
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Do you perform ATE test after TCT?
Maybe it is ATE-induced. |
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Posted by Rivs: Mon
Jul 09, 2007 10:23 am Post
subject: Re: pqfn |
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Hi Paula,
Thanks for the response.
No we did not perform ATE nor manual testing. The main
purpose of the evaluation (TC loading) is to verify the
solder cracking (both on die and clip attach). |
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Posted by FARel Engr:
Tue Jul 10, 2007 4:17 pm
Post subject: |
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Hi Rivs, request your FA guys to
trace the origin of the crack and its general direction
of propagation. This should give you an idea of the
nature of the stress experienced by your devices.
Hypothesize on what could be inducing these stresses,
and conduct simulations to confirm or eliminate each
hypothesis in terms of being the most likely root cause.
By the way, do they exhibit any internal delam prior to
TC?
Good luck to the team! |
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Posted by Rivs: Tue
Jul 10, 2007 4:39 pm Post
subject: |
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FARel Engr thanks for the respone, actually I'm handling
both FA & Reliability, package crack is originating from
the leadframes half etch area, no delamination seen
prior TC on the packages. |
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Posted by mel_c: Fri
Jul 13, 2007 10:09 pm Post
subject: |
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Do extensive visual inspection
using an optical microscope or SEM and focus on the
crack pattern and propagation. After that, imagine the
forces acting on the package that could result to this
crack. You can also do cross-section to verify the
origin of the crack. Was the crack induced thermally or
mechanically? A CSAM data before and after TC can be of
help also. If ever you CSAM can do QBAM or virtual
cross-sectioning, much better. I hope this helps.
_________________
mel_c |
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Posted by Pauljnoonan:
Fri Jul 20, 2007 11:43 pm
Post subject: |
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Also do you have any time zero
units? I would be suspicious of the assembly process. It
is likely that these crack could have been caused during
assembly (perhaps during lead forming/lead shearing
process). Also check the tool history on these machines
if possible. It's normal for this type of package to have
issues during assembly if the tools are worn. If this is
the case you should see issues on time zero units. See
if evidence of the beginning of this crack exists on
time zero units. Mel c made some good suggestions
above. if you could perform CSAM or virtual cross
section on time zero units. |
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